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Two ions in one trap: ultra-high precision mass spectrometry?

TitleTwo ions in one trap: ultra-high precision mass spectrometry?
Publication TypeConference Paper
Year of Publication2003
AuthorsRainville, S, Thompson, JK, Pritchard, DE
Conference Name2002 Conference on Precision Electromagnetic Measurement, Conference Digest Conference on Precision Electromagnetic Measurements
PublisherIEEE
Conference LocationOttawa, Ont., Canada
URLhttp://ieeexplore.ieee.org/lpdocs/epic03/wrapper.htm?arnumber=1034849
DOI10.1109/CPEM.2002.1034849